Scanning Electron Microscopy with Energy Dispersive Spectrometry (SEM/EDS)


The scanning electron microscope (SEM) is used to image extremely small particles using an electron beam that scans over the particle. Given off during this scanning are characteristics x-rays that the energy dispersive spectrometer (EDS) can use to determine the elemental makeup of the particle. SEM/EDS is used in the analysis of gunshot residues, explosives, tape, soil, paint and substance identification.